发明名称 STYLUS ARM
摘要 <P>PROBLEM TO BE SOLVED: To enable a measurement object, even if it has a troubled part on a measuring route that is linear in a planar view, to be measured without being obstructed by the troubled part. <P>SOLUTION: A stylus arm (22) for use in and provided on a contour shape measuring device has styluses (30 and 32) brought into contact with the surface (H) of a measurement object (B). The device measures the surface roughness and shape of the measurement object by driving the stylus arm along one axis in a planar view and on the basis of the up-and-down movements of the styluses following the surface convexes and concaves of the measurement object. This stylus arm has a thin and long arm part (19) and first and second styluses (30 and 32) disposed at intervals in the lengthwise direction of the arm part, each stylus having a contact end enabled to come into contact with the surface of the measurement object. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012255713(A) 申请公布日期 2012.12.27
申请号 JP20110128828 申请日期 2011.06.09
申请人 KOSAKA LABORATORY LTD 发明人 NISHIZAWA KENTARO;AOKAGE MASAAKI
分类号 G01B5/28;G01B5/20 主分类号 G01B5/28
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