发明名称 LIQUID PROCESSING APPARATUS AND LIQUID PROCESSING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a liquid processing apparatus which efficiently processes a pattern formation surface of a wafer while preventing the diffusion of a chemical atmosphere that may occur during chemical processing. <P>SOLUTION: A liquid processing apparatus 10 comprises: a process fluid nozzle 65 provided above a wafer W and having a discharge port discharging a chemical to the wafer W; a process fluid supply mechanism 70 supplying the chemical to the process fluid nozzle 65; and a cover mechanism 60 covering the wafer W from above when the chemical is discharged to the wafer W by the process fluid nozzle 65. The cover mechanism 60 is vertically driven by a lifting drive mechanism 78 between a falling position where the cover mechanism 60 covers the wafer W from above and a lifting position that is positioned higher than the falling position. Further, the liquid processing apparatus 10 includes an air hood 31 shielding the wafer W from the cover mechanism 60 in the vertical direction when the cover mechanism 60 is positioned at the lifting position and generating down flow of a clean gas. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012256745(A) 申请公布日期 2012.12.27
申请号 JP20110129241 申请日期 2011.06.09
申请人 TOKYO ELECTRON LTD 发明人 ITO KIKO;AIURA KAZUHIRO
分类号 H01L21/304;H01L21/306 主分类号 H01L21/304
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