发明名称 FABRICATION OF ANTI-REFLECTIVE SILICON SURFACE USING METALLIC IONS
摘要 PURPOSE: A method for manufacturing an anti-reflective silicon wafer using metal ions is provided to reduce silicon costs by decreasing an etching speed of a silicon wafer to reduce an amount of silicon wafers. CONSTITUTION: Metal with a lower electron affinity than silicon is ionized in alkali solvents. The surface of a silicon wafer is irregularized by contacting the silicon wafer with solutions. The metal has higher reduction power than the silicon. The silicon wafer is contacted with the solutions at 40 to 80 degrees centigrade. The height of an uneven part on the surface of the silicon wafer is selectively controlled by controlling the temperature of the solutions.
申请公布号 KR20120138438(A) 申请公布日期 2012.12.26
申请号 KR20110057916 申请日期 2011.06.15
申请人 KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE 发明人 SONG, JAE YONG;PARK, HYUN MIN;PARK, SUN HWA
分类号 H01L21/306 主分类号 H01L21/306
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