发明名称
摘要 <p>A semiconductor memory device includes a delay locked loop for correcting a duty cycle rate of a delay locked clock signal. The semiconductor memory device includes a delay locked circuit, a duty cycle correction circuit, and a clock synchronization circuit. The delay locked circuit outputs a delay locked clock by delaying a system clock by a predetermined time. The duty cycle correction circuit outputs a first clock by correcting a duty cycle of the delay locked clock, wherein the proportion of high to low level periods of the delay locked clock is controlled according to a time difference between a second edge of the first clock and that of a second clock derived from the first clock. The clock synchronization circuit synchronizes a first edge of the first clock with that of the second clock.</p>
申请公布号 JP5106002(B2) 申请公布日期 2012.12.26
申请号 JP20070220652 申请日期 2007.08.28
申请人 发明人
分类号 G11C11/4076;G06F1/06;G11C11/407;H03K5/04;H03K5/13;H03K5/26 主分类号 G11C11/4076
代理机构 代理人
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