发明名称 METHOD FOR MANUFACTURING CONTACTOR, METHOD FOR MANUFACTURING SEMICONDUCTOR INSPECTION APPARATUS, CONTACTOR AND SEMICONDUCTOR INSPECTION APPARATUS INCLUDING THE SAME
摘要 PURPOSE: A method for manufacturing a contactor, a method for manufacturing a semiconductor inspection apparatus, a contactor and a semiconductor inspection apparatus including the same are provided to inspect a large scale integrated circuit or a non-memory semiconductor. CONSTITUTION: One end of a contactor(3) comes into contact with a semiconductor. The contactor is formed in a taper form or cutting edge shape by being wet etched through an alkali solution. An epoxy resin layer connects multiple contactors to a substrate(5).
申请公布号 KR101215366(B1) 申请公布日期 2012.12.26
申请号 KR20120069683 申请日期 2012.06.28
申请人 PT&K CO., LTD. 发明人 KIM, TAE YOON;LEE, SU YOUNG
分类号 G01R1/067;G01R31/26;H01L21/66 主分类号 G01R1/067
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