发明名称 |
METHOD FOR MANUFACTURING CONTACTOR, METHOD FOR MANUFACTURING SEMICONDUCTOR INSPECTION APPARATUS, CONTACTOR AND SEMICONDUCTOR INSPECTION APPARATUS INCLUDING THE SAME |
摘要 |
PURPOSE: A method for manufacturing a contactor, a method for manufacturing a semiconductor inspection apparatus, a contactor and a semiconductor inspection apparatus including the same are provided to inspect a large scale integrated circuit or a non-memory semiconductor. CONSTITUTION: One end of a contactor(3) comes into contact with a semiconductor. The contactor is formed in a taper form or cutting edge shape by being wet etched through an alkali solution. An epoxy resin layer connects multiple contactors to a substrate(5). |
申请公布号 |
KR101215366(B1) |
申请公布日期 |
2012.12.26 |
申请号 |
KR20120069683 |
申请日期 |
2012.06.28 |
申请人 |
PT&K CO., LTD. |
发明人 |
KIM, TAE YOON;LEE, SU YOUNG |
分类号 |
G01R1/067;G01R31/26;H01L21/66 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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