发明名称 BIPOLAR PUNCH-THROUGH SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SUCH A SEMICONDUCTOR DEVICE
摘要 PURPOSE: A bipolar punch through semiconductor device and a manufacturing method thereof are provided to reduce electron-hole plasma in an on state by arranging a defective layer in an intersection between an anode buffer and an anode contact layer. CONSTITUTION: A first conductive drift layer(2) is formed on a cathode side(13). A second conductive anode layer(3) is formed on an anode side(14) opposite to the cathode side. The anode layer includes an anode contact layer(5) and an anode buffer layer(4). An anode electrode(7) is formed on the anode contact layer. A cathode layer(25) is formed under the first conductive drift layer.
申请公布号 KR20120138689(A) 申请公布日期 2012.12.26
申请号 KR20120063300 申请日期 2012.06.13
申请人 ABB TECHNOLOGY AG 发明人 MATTHIAS SVEN
分类号 H01L21/328;H01L29/861 主分类号 H01L21/328
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