| 发明名称 |
Methods and systems for determining optimal features for classifying patterns or objects in images |
| 摘要 |
Provided are methods for determining optimal features for classifying patterns or objects. Also provided are methods for image analysis. Further provided are methods for image searching.
|
| 申请公布号 |
US8340437(B2) |
申请公布日期 |
2012.12.25 |
| 申请号 |
US20080601784 |
申请日期 |
2008.05.29 |
| 申请人 |
ABRAMOFF MICHAEL;SOLIZ PETE;RUSSELL STEPHEN;UNIVERSITY OF IOWA RESEARCH FOUNDATION |
发明人 |
ABRAMOFF MICHAEL;SOLIZ PETE;RUSSELL STEPHEN |
| 分类号 |
G06K9/00;G06K9/46 |
主分类号 |
G06K9/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
|
| 地址 |
|
