发明名称 Substrate processing method and substrate processing apparatus
摘要 A substrate processing apparatus according to the present invention is provided with a spin chuck (3) that holds a substrate (W) and rotates the same. A process liquid supply system (11, . . . ) is disposed to supply a process liquid to the substrate rotated by the spin chuck. There are disposed a fluid nozzle (12) that supplies to the substrate a drying fluid having a higher volatility than that of the process liquid, and an inert gas nozzle (13) that supplies an inert gas to the substrate. A nozzle moving mechanism (15, 52, . . . ) is disposed that moves the nozzles (12, 13) radially outward relative to a rotational center (Po) of the substrate, while maintaining the inert gas nozzle nearer to the rotational center of the substrate than the fluid nozzle.
申请公布号 US8337659(B2) 申请公布日期 2012.12.25
申请号 US20050578099 申请日期 2005.10.12
申请人 ORII TAKEHIKO;SEKIGUCHI KENJI;UCHIDA NORITAKA;TANAKA SATORU;OHNO HIROKI;TOKYO ELECTRON LIMITED 发明人 ORII TAKEHIKO;SEKIGUCHI KENJI;UCHIDA NORITAKA;TANAKA SATORU;OHNO HIROKI
分类号 H01L21/306;C23F1/00 主分类号 H01L21/306
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