发明名称 Flash memory device with isolation structure
摘要 A flash memory device includes trenches that are formed at regions on a semiconductor substrate spaced apart from one another at predetermined distances, buried floating gates buried into the trenches, a plurality of isolation structures formed between the buried floating gates, and a dielectric film and a control gate formed on the buried floating gates.
申请公布号 US8338878(B2) 申请公布日期 2012.12.25
申请号 US20080323657 申请日期 2008.11.26
申请人 KIM KI SEOG;HYNIX SEMICONDUCTOR INC. 发明人 KIM KI SEOG
分类号 H01L29/788 主分类号 H01L29/788
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