发明名称 Wafer level chip scale package having an enhanced heat exchange efficiency with an EMF shield and a method for fabricating the same
摘要 A wafer level chip scale package having an enhanced heat exchange efficiency with an EMF shield is presented. The wafer level chip scale package includes a semiconductor chip, an insulation layer, and a metal plate. The semiconductor chip has a plurality of bonding pads on an upper face thereof. The insulation layer is disposed over the upper face of the semiconductor chip and has openings that expose some portions of the bonding pads. The metal plate covers an upper face of the insulation layer and side faces of the semiconductor chip in which the metal plate is electrically insulated from the bonding pads.
申请公布号 US8338921(B2) 申请公布日期 2012.12.25
申请号 US201113289365 申请日期 2011.11.04
申请人 PARK CHANG JUN;HAN KWON WHAN;KIM SEONG CHEOL;KIM SUNG MIN;CHOI HYEONG SEOK;LEE HA NA;OH TAC KEUN;LIM SANG JOON;SK HYNIX INC. 发明人 PARK CHANG JUN;HAN KWON WHAN;KIM SEONG CHEOL;KIM SUNG MIN;CHOI HYEONG SEOK;LEE HA NA;OH TAC KEUN;LIM SANG JOON
分类号 H01L23/48;H01L21/28 主分类号 H01L23/48
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