发明名称 |
A SYSTEM FOR CONTROLLING TEST DEVICE |
摘要 |
PURPOSE: A system for controlling a test apparatus is provided to prevent holding in the network failure and to maintain performance of a tester. CONSTITUTION: A system for controlling a test apparatus comprises a test apparatus management server(110) and a tester. A server creates a test performing signal for testing a semiconductor device. A plurality of testers is connected to the server through a network and receives the test performing signal and successively testes the semiconductor device. The plurality of testers is connected to the server by systematic interface and protocol and individually operates. Each tester comprises a control program and communicates with the server about progress situations of a test and the state of the network using the interface and the protocol. [Reference numerals] (110) Test apparatus management server; (112) Database; (114) Test performing signal generating part; (130) Tester; (AA) Interface and the protocol |
申请公布号 |
KR101212823(B1) |
申请公布日期 |
2012.12.21 |
申请号 |
KR20120055249 |
申请日期 |
2012.05.24 |
申请人 |
IT&T;U-TECH SOLUTION |
发明人 |
LEE, MIN JAE;LIM, JI HOON;PARK, JONG SEOK |
分类号 |
G01R31/26;H01L21/66 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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