| 摘要 |
PURPOSE: A method for testing a super capacitor of a chip type is provided to perform a test all super capacitors accepted in a tray through a primary test and a secondary test by probing the super capacitors with a probe pin even if location and direction of the super capacitors are different. CONSTITUTION: A super capacitor is accepted in receiving spaces of a tray(S81). A probe pin of a probe substrate is touched with the super capacitor of the tray and a primary test of the super capacitor is performed(S85). The tray is rotated 90 degrees from the probe substrate. The probe pin of the probe substrate is touched with the super capacitor of the tray and a secondary test of the super capacitor is performed(S89). [Reference numerals] (AA) Start; (BB) End; (S81) Accepting a chip type super capacitor in a tray; (S83) Loading a tray on a test device; (S85) First test by touching the super capacitor of the tray with a probe pin of a probe substrate; (S87) Rotating a tray at 90 degrees; (S89) Second test by touching the super capacitor of the tray with a probe pin of a probe substrate; (S91) Unloading a tray from a test device
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