发明名称 ENCLOSED LASER-ULTRASONIC INSPECTION SYSTEM
摘要 <p>A laser ultrasonic inspection system comprises laser sources configured to generate laser beams, an optical scanner configured to direct the laser beams onto an object thereby generating ultrasonic waves in the object and illuminating the object, an interferometer configured to generate an electrical signal in response to the reflected light, and a radiation restricting inspection chamber for housing the object. Another laser ultrasonic inspection system comprises a radiation restricting inspection chamber, laser sources located outside of the inspection chamber, an optical scanner located inside the inspection chamber, a visible laser tracer representative of the orientation of the laser beams; an interferometer, a scanner positioning mechanism, and an object positioning mechanism. A method for inspecting an object comprises the steps of positioning an object inside of an inspection chamber, defining a scanning profile, and directing laser beams onto the object according to the inspection profile.</p>
申请公布号 WO2012174290(A1) 申请公布日期 2012.12.20
申请号 WO2012US42528 申请日期 2012.06.14
申请人 DUBOIS, MARC;DRAKE, THOMAS, E. 发明人 DUBOIS, MARC;DRAKE, THOMAS, E.
分类号 G01B9/02 主分类号 G01B9/02
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