发明名称 |
METHOD AND APPARATUS FOR IMPLEMENTING PROBES FOR ELECTRONIC CIRCUIT TESTING |
摘要 |
Disclosed is an improved probe having a spring portion which allows effective contact with a device under test without requiring a lower die portion. The probe includes a slot retention and placement portion, which provides for an improved approach for manufacturing arrangements of probes, where the slot retention and placement portions of the probe facilitate precise placement and alignment of the probes while not excessively increasing the cost or complexity of the probes and probe cards. |
申请公布号 |
US2012319710(A1) |
申请公布日期 |
2012.12.20 |
申请号 |
US201113160851 |
申请日期 |
2011.06.15 |
申请人 |
DABROWIECKI KRZYSZTOF;CLEGG SCOTT;PROBELOGIC, INC. |
发明人 |
DABROWIECKI KRZYSZTOF;CLEGG SCOTT |
分类号 |
G01R1/067;G01R31/00;H01R43/00 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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