发明名称 Methods for Via Structure with Improved Reliability
摘要 Methods for forming a via structure are provided. The method includes depositing a first-layer conductive line over a semiconductor substrate, forming a dielectric layer over the first-layer conductive line, forming a via opening in the dielectric layer and exposing the first-layer conductive line in the via opening, forming a recess portion in the first-layer conductive line, and filling the via opening to form a via extending through the dielectric layer to the first-layer conductive line. The via has a substantially tapered profile and substantially extends into the recess in the first-layer conductive line.
申请公布号 US2012322261(A1) 申请公布日期 2012.12.20
申请号 US201213595835 申请日期 2012.08.27
申请人 SHUE SHAU-LIN;HUANG CHENG-LIN;HSIEH CHING-HUA;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 SHUE SHAU-LIN;HUANG CHENG-LIN;HSIEH CHING-HUA
分类号 H01L21/768 主分类号 H01L21/768
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