发明名称 SEMICONDUCTOR STRUCTURES AND METHODS OF FORMING THE SAME
摘要 A semiconductor structure includes a through-substrate-via (TSV) structure disposed in a substrate. A first etch stop layer is disposed over the TSV structure. A first dielectric layer is disposed in contact with the first etch stop layer. A first conductive structure is disposed through the first etch stop layer and the first dielectric layer. The first conductive structure is electrically coupled with the TSV structure. The TSV structure is substantially wider than the first conductive structure. A second etch stop layer is disposed in contact with the first dielectric layer. A metal-insulator-metal (MIM) capacitor structure is disposed in contact with the second etch stop layer.
申请公布号 US2012319239(A1) 申请公布日期 2012.12.20
申请号 US201113161076 申请日期 2011.06.15
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHANG CHUN HUA;HUANG SUNG-HUI;YEH DER-CHYANG
分类号 H01L29/92;H01L21/02 主分类号 H01L29/92
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