发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <p>A method for manufacturing a semiconductor device comprises the steps of: (D) forming an electroconductive film (9) containing a first metal on an oxide semiconductor layer (7) containing a second metal and forming a reactive layer (15) containing the first metal and the second metal on the bordering surfaces of the electroconductive film (9) and the oxide semiconductor layer (7); and (E) removing the portions in the electroconductive film (9) and the reactive layer (15) that are positioned over an area (7c) of the oxide semiconductor layer (7) that constitutes a channel area; step (E) comprising the steps of: (E1) performing dry etching on the electroconductive film (9) and the reactive layer (15) under conditions such that a residue containing the first metal remains on the channel area (7c); and (E2) removing at least some of the residue remaining on the channel area (7c) by wet etching after step (E1).</p>
申请公布号 WO2012173035(A1) 申请公布日期 2012.12.20
申请号 WO2012JP64662 申请日期 2012.06.07
申请人 SHARP KABUSHIKI KAISHA;TOMIYASU KAZUHIDE;NAKAZAWA MAKOTO;MORIGUCHI MASAO;KANZAKI YOHSUKE 发明人 TOMIYASU KAZUHIDE;NAKAZAWA MAKOTO;MORIGUCHI MASAO;KANZAKI YOHSUKE
分类号 H01L21/336;H01L21/28;H01L21/306;H01L21/3065;H01L29/786 主分类号 H01L21/336
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