发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
<p>A method for manufacturing a semiconductor device comprises the steps of: (D) forming an electroconductive film (9) containing a first metal on an oxide semiconductor layer (7) containing a second metal and forming a reactive layer (15) containing the first metal and the second metal on the bordering surfaces of the electroconductive film (9) and the oxide semiconductor layer (7); and (E) removing the portions in the electroconductive film (9) and the reactive layer (15) that are positioned over an area (7c) of the oxide semiconductor layer (7) that constitutes a channel area; step (E) comprising the steps of: (E1) performing dry etching on the electroconductive film (9) and the reactive layer (15) under conditions such that a residue containing the first metal remains on the channel area (7c); and (E2) removing at least some of the residue remaining on the channel area (7c) by wet etching after step (E1).</p> |
申请公布号 |
WO2012173035(A1) |
申请公布日期 |
2012.12.20 |
申请号 |
WO2012JP64662 |
申请日期 |
2012.06.07 |
申请人 |
SHARP KABUSHIKI KAISHA;TOMIYASU KAZUHIDE;NAKAZAWA MAKOTO;MORIGUCHI MASAO;KANZAKI YOHSUKE |
发明人 |
TOMIYASU KAZUHIDE;NAKAZAWA MAKOTO;MORIGUCHI MASAO;KANZAKI YOHSUKE |
分类号 |
H01L21/336;H01L21/28;H01L21/306;H01L21/3065;H01L29/786 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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