发明名称 TEST CIRCUIT FOR BIPOLAR JUNCTION TRANSISTOR
摘要 A test circuit includes a first test circuit. The first test circuit includes a first light-emitting diode (LED) and a first resistor. An anode of the first LED is connected to a power supply. A cathode of the first LED is connected to a collector of a bipolar junction transistor (BJT) through the first resistor. An emitter of the BJT is grounded. A base of the BJT is connected to the power supply. A type of the BJT can be determined according to status of the first LED.
申请公布号 US2012319720(A1) 申请公布日期 2012.12.20
申请号 US201113217257 申请日期 2011.08.25
申请人 TU YI-XIN;ZHOU HAI-QING;HON HAI PRECISION INDUSTRY CO., LTD.;HONG FU JIN PRECSION INDUSTRY (SHENZHEN) CO., LTD. 发明人 TU YI-XIN;ZHOU HAI-QING
分类号 G01R31/26 主分类号 G01R31/26
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