发明名称 |
TEST CIRCUIT FOR BIPOLAR JUNCTION TRANSISTOR |
摘要 |
A test circuit includes a first test circuit. The first test circuit includes a first light-emitting diode (LED) and a first resistor. An anode of the first LED is connected to a power supply. A cathode of the first LED is connected to a collector of a bipolar junction transistor (BJT) through the first resistor. An emitter of the BJT is grounded. A base of the BJT is connected to the power supply. A type of the BJT can be determined according to status of the first LED.
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申请公布号 |
US2012319720(A1) |
申请公布日期 |
2012.12.20 |
申请号 |
US201113217257 |
申请日期 |
2011.08.25 |
申请人 |
TU YI-XIN;ZHOU HAI-QING;HON HAI PRECISION INDUSTRY CO., LTD.;HONG FU JIN PRECSION INDUSTRY (SHENZHEN) CO., LTD. |
发明人 |
TU YI-XIN;ZHOU HAI-QING |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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