| 摘要 |
<P>PROBLEM TO BE SOLVED: To reduce an occupied area that is required for a circuit for storing an address of a defective selection line. <P>SOLUTION: A semiconductor device according to one embodiment comprises: multiple first and second selection lines that are individually connected to multiple memory cells; a first redundant selection line that can be substituted for a defective first selection line among the first selection lines but cannot be substituted for a defective second selection line among the second selection lines; and a second redundant selection line that can be substituted for each of defective first and second selection lines. Therefore, the defective first selection line is substituted for either one of the first and second redundant selection lines, and the defective second selection line is not substituted for the first redundant selection line but is substituted for the second redundant selection line. As a result, the number of address bits for selecting the first redundant selection line becomes smaller than that for selecting the second redundant selection line, and the number of ROMs for storing a corresponding defective address also decreases. <P>COPYRIGHT: (C)2013,JPO&INPIT |
