发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
A method for fabricating a semiconductor device, comprising: forming n-channel field-effect transistors on a silicon substrate; forming a first insulating film covering the field-effect transistors; shrinking the first insulating film; forming a second insulating film over the first insulating film; and shrinking the second insulating film, wherein the forming an insulating film covering the field-effect transistors and the shrinking the insulating film are repeated a plurality of time.
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申请公布号 |
US2012322272(A1) |
申请公布日期 |
2012.12.20 |
申请号 |
US201213598010 |
申请日期 |
2012.08.29 |
申请人 |
OWADA TAMOTSU;WATATANI HIROFUMI;FUJITSU SEMICONDUCTOR LIMITED |
发明人 |
OWADA TAMOTSU;WATATANI HIROFUMI |
分类号 |
H01L21/268 |
主分类号 |
H01L21/268 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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