发明名称 SLIT-LAMP MICROSCOPE
摘要 <p>Provided is a slit-lamp microscope capable suitably and readily setting an optical system. Reference setting conditions information (110) in which reference setting conditions of an illumination system (8) and an observation system (6) are correlated with respect to each of a plurality of locations of a subjective eye (E) are stored in advance in a storage unit (102) of the slit-lamp microscope (1). A search unit (121) searches for reference setting conditions corresponding to the location specified by an operation unit (104) from the reference setting conditions information (110). A setting state acquisition unit (122) acquires the current setting state of the illumination system (8) and the observation system (8). A setting state identification unit (123) identifies items in the current setting state acquired from the setting state acquisition unit (122) that are different from the reference setting conditions searched by the search unit (121). A control unit (101) displays information based on the identification results on a display unit (103).</p>
申请公布号 WO2012172907(A1) 申请公布日期 2012.12.20
申请号 WO2012JP62464 申请日期 2012.05.16
申请人 KABUSHIKI KAISHA TOPCON;UCHIYAMA,TAKUMI 发明人 UCHIYAMA,TAKUMI
分类号 A61B3/12 主分类号 A61B3/12
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