发明名称 |
Specimen preparation apparatus, specimen preparation/analysis system and specimen plate |
摘要 |
<p>Provided is a specimen preparation apparatus capable of supplying a specimen from the specimen preparation apparatus to a specimen analyzer without burdening an operator. This specimen preparation apparatus comprises a stained specimen preparation part (1, 2, 6, 7) for preparing a specimen on a slide glass (10) and staining the specimen, a keeping part (9) for storing the stained specimen slide glass prepared in the stained specimen preparation part and a control part (110) for deciding whether to supply the stained specimen slide glass to the keeping part or to the external apparatus.</p> |
申请公布号 |
EP1612537(B1) |
申请公布日期 |
2012.12.19 |
申请号 |
EP20050014030 |
申请日期 |
2005.06.29 |
申请人 |
SYSMEX CORPORATION |
发明人 |
NAKAYA, MASANORI;HYOUSA, YOSHIHIRO;KITAGAWA, SHIGERU;KOBAYASHI, EISUKE;HIGUCHI, HIDEYUKI |
分类号 |
G01N1/31;G01N1/28;G01N35/00 |
主分类号 |
G01N1/31 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|