发明名称 Specimen preparation apparatus, specimen preparation/analysis system and specimen plate
摘要 <p>Provided is a specimen preparation apparatus capable of supplying a specimen from the specimen preparation apparatus to a specimen analyzer without burdening an operator. This specimen preparation apparatus comprises a stained specimen preparation part (1, 2, 6, 7) for preparing a specimen on a slide glass (10) and staining the specimen, a keeping part (9) for storing the stained specimen slide glass prepared in the stained specimen preparation part and a control part (110) for deciding whether to supply the stained specimen slide glass to the keeping part or to the external apparatus.</p>
申请公布号 EP1612537(B1) 申请公布日期 2012.12.19
申请号 EP20050014030 申请日期 2005.06.29
申请人 SYSMEX CORPORATION 发明人 NAKAYA, MASANORI;HYOUSA, YOSHIHIRO;KITAGAWA, SHIGERU;KOBAYASHI, EISUKE;HIGUCHI, HIDEYUKI
分类号 G01N1/31;G01N1/28;G01N35/00 主分类号 G01N1/31
代理机构 代理人
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