发明名称 MICROELECTRONIC DEVICES WITH THROUGH-SUBSTRATE INTERCONNECTS AND ASSOCIATED METHODS OF MANUFACTURING
摘要 Microelectronic devices with through-substrate interconnects and associated methods of manufacturing are disclosed herein. In one embodiment, a semiconductor device includes a semiconductor substrate carrying first and second metallization layers. The second metallization layer is spaced apart from the semiconductor substrate with the first metallization layer therebetween. The semiconductor device also includes a conductive interconnect extending at least partially through the semiconductor substrate. The first metallization layer is in electrical contact with the conductive interconnect via the second metallization layer.
申请公布号 EP2534682(A2) 申请公布日期 2012.12.19
申请号 EP20110740230 申请日期 2011.01.31
申请人 MICRON TECHNOLOGY, INC. 发明人 KIRBY, KYLE, K.;PAREKH, KUNAL, R.;NIROUMAND, SARAH, A.
分类号 H01L23/00;H01L21/768;H01L23/48;H01L25/065 主分类号 H01L23/00
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