发明名称 Semiconductor device and inspection method therefor
摘要 A method of fabricating a semiconductor device, including forming a circuit block in a peripheral edge portion of a semiconductor chip, forming a circuit block pad on the circuit block to provide an electrical interface for the circuit block, and forming a bonding pad laterally offset from the circuit block and the circuit block pad, the bonding pad being electrically connected to the circuit block pad and providing a bonding wire pad for the circuit block.
申请公布号 US8334201(B2) 申请公布日期 2012.12.18
申请号 US20110929631 申请日期 2011.02.04
申请人 KATOU TETSUYA;RENESAS ELECTRONICS CORPORATION 发明人 KATOU TETSUYA
分类号 H01L23/48;H01L23/52;H01L29/40 主分类号 H01L23/48
代理机构 代理人
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