发明名称 Wear leveling method for non-volatile memory device having single and multi level memory cell blocks
摘要 A method of executing a wear leveling operation within a non-volatile memory including a single-level memory cell block (SLC) and a multi-level memory cell block (MLC) is disclosed. The method includes calculating an average erase point in relation to a number of programming/erase (P/E) operations applied to a logical block address (LBA), a SLC mode usage point in relation to a number of the P/E operations applied to the SLC, a MLC mode usage point in relation to a number of the P/E operations applied to the MLC, and a wear value in relation to the average erase point, the SLC mode usage point, and the MLC mode usage point; and then if the wear value exceeds a defined threshold value, performing the wear leveling operation.
申请公布号 US8335886(B2) 申请公布日期 2012.12.18
申请号 US20090534358 申请日期 2009.08.03
申请人 LEE YANG-SUP;SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE YANG-SUP
分类号 G06F12/00;G06F13/00;G06F13/28;G11C16/04;G11C16/06 主分类号 G06F12/00
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