| 摘要 |
A method and an apparatus for measuring a phase shift between a first and a second signal, comprising the steps of shifting the first signal in frequency by an offset frequency, superposing the frequency-shifted first signal and the second signal, determining an envelope signal of the superposed signal, and measuring a phase shift of the envelope signal at the offset frequency, or a multiple thereof, with respect to the phase of the offset frequency, wherein the phase shift is measured by determining a Fourier coefficient of the envelope signal at the offset frequency and extracting its phase. The invention further relates to an apparatus implementing the method. |
