发明名称 Pattern dimension calculation method and computer program product
摘要 A pattern dimension calculation method according to one embodiment calculates a taper shape of a mask member used as a mask when a circuit pattern is processed in an upper layer of the circuit pattern formed on a substrate. The method calculates an opening angle facing the mask member from a shape prediction position on the circuit pattern on the basis of the taper shape. The method calculates a dimension of the circuit pattern according to the opening angle formed at the shape prediction position.
申请公布号 US8336005(B2) 申请公布日期 2012.12.18
申请号 US201113050864 申请日期 2011.03.17
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 TAGUCHI TAKAFUMI;KOTANI TOSHIYA;MASHITA HIROMITSU;NAKAJIMA FUMIHARU;ABURADA RYOTA;KODAMA CHIKAAKI
分类号 G06F17/50 主分类号 G06F17/50
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