发明名称 |
Pattern dimension calculation method and computer program product |
摘要 |
A pattern dimension calculation method according to one embodiment calculates a taper shape of a mask member used as a mask when a circuit pattern is processed in an upper layer of the circuit pattern formed on a substrate. The method calculates an opening angle facing the mask member from a shape prediction position on the circuit pattern on the basis of the taper shape. The method calculates a dimension of the circuit pattern according to the opening angle formed at the shape prediction position.
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申请公布号 |
US8336005(B2) |
申请公布日期 |
2012.12.18 |
申请号 |
US201113050864 |
申请日期 |
2011.03.17 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
TAGUCHI TAKAFUMI;KOTANI TOSHIYA;MASHITA HIROMITSU;NAKAJIMA FUMIHARU;ABURADA RYOTA;KODAMA CHIKAAKI |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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