发明名称 |
Test and measurement instrument with bit-error detection |
摘要 |
A test and measurement instrument including an input configured to receive a signal and output digitized data; a memory configured to store reference digitized data including a reference sequence; a pattern detector configured to detect the reference sequence in the digitized data and generate a synchronization signal in response; a memory controller configured to cause the memory to output the reference digitized data in response to the synchronization signal; and a comparator configured to compare the reference digitized data output from the memory to the digitized data. |
申请公布号 |
US8335950(B2) |
申请公布日期 |
2012.12.18 |
申请号 |
US20090628402 |
申请日期 |
2009.12.01 |
申请人 |
TRAN QUE THUY;TEKTRONIX, INC. |
发明人 |
TRAN QUE THUY |
分类号 |
G06F11/00;G01R31/28 |
主分类号 |
G06F11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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