发明名称 |
METHOD FOR MEASURING SLICE THICKNESS, PHANTOM, AND X-RAY CT SCANNER |
摘要 |
<P>PROBLEM TO BE SOLVED: To stably measure slice thickness of a tomogram obtained by X-ray CT scanning. <P>SOLUTION: A phantom has a member including a part 52a formed so that slice-thickness direction (z-direction) thickness in a slice space 60 subject to the X-ray CT scanning can be linearly changed with respect to one direction (e.g. x-direction) perpendicular to the slice-thickness direction. The slice thickness t of the tomogram 61 is determined on the basis of a first profile P1 obtained by performing the first derivation of a profile P0 of a one-direction pixel value of the tomogram 61 obtained by performing the X-ray CT scanning of the phantom. Differently from a conventional phantom made of a wire and a plate, the phantom like this enables the slice thickness to be stably measured because a slope surface can be easily worked and maintained with high linear precision without the risk of rupture. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012245234(A) |
申请公布日期 |
2012.12.13 |
申请号 |
JP20110120525 |
申请日期 |
2011.05.30 |
申请人 |
GE MEDICAL SYSTEMS GLOBAL TECHNOLOGY CO LLC |
发明人 |
NISHIDE AKIHIKO |
分类号 |
A61B6/03 |
主分类号 |
A61B6/03 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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