发明名称 METHOD FOR MEASURING SLICE THICKNESS, PHANTOM, AND X-RAY CT SCANNER
摘要 <P>PROBLEM TO BE SOLVED: To stably measure slice thickness of a tomogram obtained by X-ray CT scanning. <P>SOLUTION: A phantom has a member including a part 52a formed so that slice-thickness direction (z-direction) thickness in a slice space 60 subject to the X-ray CT scanning can be linearly changed with respect to one direction (e.g. x-direction) perpendicular to the slice-thickness direction. The slice thickness t of the tomogram 61 is determined on the basis of a first profile P1 obtained by performing the first derivation of a profile P0 of a one-direction pixel value of the tomogram 61 obtained by performing the X-ray CT scanning of the phantom. Differently from a conventional phantom made of a wire and a plate, the phantom like this enables the slice thickness to be stably measured because a slope surface can be easily worked and maintained with high linear precision without the risk of rupture. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012245234(A) 申请公布日期 2012.12.13
申请号 JP20110120525 申请日期 2011.05.30
申请人 GE MEDICAL SYSTEMS GLOBAL TECHNOLOGY CO LLC 发明人 NISHIDE AKIHIKO
分类号 A61B6/03 主分类号 A61B6/03
代理机构 代理人
主权项
地址