| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit in which a determination can be made about a frequency of an output pulse of a class-D amplifier within a short required time while utilizing a semiconductor testing apparatus. <P>SOLUTION: A semiconductor integrated circuit 1 comprises a class-D amplifier 100, a selector 140, and a counter 150. The counter 150 defines an output signal OUTP or OUTM selected by the selector 140 as a monitor target pulse and outputs a count end signal CO from an output terminal when a predetermined number of monitor target pulses are counted after a reset signal RST is canceled. Therefore, by determining whether to output the count end signal CO within a predetermined period after the lapse of a predetermined time from the cancellation of the reset signal RST, it can be determined whether or not a frequency of an output signal of the class-D amplifier 100 is settled within a proper range. <P>COPYRIGHT: (C)2013,JPO&INPIT |
