| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an interference light measuring apparatus for photographing an object to be measured by reducing influences of strong reflecting light from the object to be measured. <P>SOLUTION: The interference light measuring apparatus has a light source unit, an interference optical system, a scanning part, a photographing optical system, an specifying part, and a control unit. The interference optical system divides low coherence light from the light source unit into signal light and referential light, superimposes reflecting light of the signal light by the eye to be tested and the referential light to generate interference light, and detects it. The scanning part scans an irradiation position of the signal light with respect to the eye to be tested. The photographing optical system is coaxial to a light path of the signal light in the interference optical system and photographs a front eye part of the eye to be tested. The specifying part specifies a strong reflection position being an irradiation position by the scanning part when the reflecting light of the signal light is in a strong reflecting state on the basis of a photographic image by the photographic operation system. The control unit lowers a quantity of low coherence light by controlling the light source unit when irradiating the specified strong reflection position with the signal light. <P>COPYRIGHT: (C)2013,JPO&INPIT |
