METHOD AND DEVICE FOR CHARACTERIZING SURFACES

摘要

The invention relates to a method for characterizing a surface, characterized in that it comprises the following steps: measuring the topography of the surface to be characterized (S, Pa, Lb) in order to determine a measurement vector (mesV); interpolating the modal vectors of a modal base (Q) of a reference geometric element for each measured location (Xi, Yj) of the surface to be characterized (S, Pa, Lb), the modal base being pre-stored in a memory for a predetermined number of modes, in order to obtain an interpolated modal base (intQ) in which each modal vector has a dimension identical to the dimension (nmes, 1) of the measurement vector (mesV); and decomposing the measurement vector (mesV) in the interpolated modal base (intQ) by means of a vector projection operation of the measurement vector (mesV) in the interpolated modal base (intQ) for the predetermined number of modes (?q), in order to determine the contributions (?1) of each of the modes in the surface to be characterized. The invention also relates to a device for characterizing surfaces to implement said method for characterizing surfaces.