发明名称 |
SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF |
摘要 |
<p>Provided are a semiconductor structure and a manufacturing method thereof. The method includes the following steps: providing a substrate, with a first high k dielectric layer, an adjustment layer, a second high k dielectric layer and a metal gate being successively formed thereon; and etching the first high k dielectric layer, the adjustment layer, the second high k layer and the metal gate to form a gate stack. Correspondingly, also provided is a semiconductor structure. In the present invention, by way of setting the adjustment layer between the two high k dielectric layers, the semiconductor performance effectively avoids being reduced because of the reaction caused by direct contact between the adjustment layer and the metal gate.</p> |
申请公布号 |
WO2012167509(A1) |
申请公布日期 |
2012.12.13 |
申请号 |
WO2011CN78922 |
申请日期 |
2011.08.25 |
申请人 |
INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;BEIJING NMC CO., LTD.;YIN, HAIZHOU;ZHU, HUILONG;LUO, ZHIJIONG |
发明人 |
YIN, HAIZHOU;ZHU, HUILONG;LUO, ZHIJIONG |
分类号 |
H01L29/423;H01L21/283;H01L29/51 |
主分类号 |
H01L29/423 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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