发明名称 SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF
摘要 <p>Provided are a semiconductor structure and a manufacturing method thereof. The method includes the following steps: providing a substrate, with a first high k dielectric layer, an adjustment layer, a second high k dielectric layer and a metal gate being successively formed thereon; and etching the first high k dielectric layer, the adjustment layer, the second high k layer and the metal gate to form a gate stack. Correspondingly, also provided is a semiconductor structure. In the present invention, by way of setting the adjustment layer between the two high k dielectric layers, the semiconductor performance effectively avoids being reduced because of the reaction caused by direct contact between the adjustment layer and the metal gate.</p>
申请公布号 WO2012167509(A1) 申请公布日期 2012.12.13
申请号 WO2011CN78922 申请日期 2011.08.25
申请人 INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;BEIJING NMC CO., LTD.;YIN, HAIZHOU;ZHU, HUILONG;LUO, ZHIJIONG 发明人 YIN, HAIZHOU;ZHU, HUILONG;LUO, ZHIJIONG
分类号 H01L29/423;H01L21/283;H01L29/51 主分类号 H01L29/423
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