| 发明名称 |
DEVICE FOR MEASURING THE CHARACTERISTICS OF AN X-RAY BEAM |
| 摘要 |
<p>The invention relates to a device for measuring the characteristics of an X-ray beam. The device comprises two stacked stages, each stage having a checkerboard structure, in which the first boxes correspond to ionisation chambers (21, 31) and the second boxes correspond to blocks (22, 32) of a material that stop electrons but not X-rays, the first boxes of one stage facing the second boxes of the other stage.</p> |
| 申请公布号 |
WO2012168601(A1) |
申请公布日期 |
2012.12.13 |
| 申请号 |
WO2012FR50629 |
申请日期 |
2012.03.27 |
| 申请人 |
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE;ARNOUD, YANNICK;GUILLAUDIN, OLIVIER |
发明人 |
ARNOUD, YANNICK;GUILLAUDIN, OLIVIER |
| 分类号 |
G01T1/169;G01T1/29 |
主分类号 |
G01T1/169 |
| 代理机构 |
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