发明名称 MANUFACTURING METHOD OF BONDED WAFER AND BONDED SOI WAFER
摘要 <P>PROBLEM TO BE SOLVED: To provide a manufacturing method of a bonded wafer capable of manufacturing bonded wafers, in which the film thickness uniformity of a thin film on a base wafer, especially, that of an SOI layer is enhanced, at a mass production level. <P>SOLUTION: The manufacturing method of a bonded wafer includes an ion implantation step using a batch ion implanter, a bonding step for bonding the ion-implanted surface of a bond wafer and the surface of a base wafer directly or via an insulating film, and a peeling step for preparing a bonded wafer having a thin film on the base wafer by peeling the bond wafer in the ion implantation layer. Ion implantation into the bond wafer is carried out several times in the ion implantation step, and after each ion implantation, the bond wafer is rotated by a predetermined rotation angle, and next ion implantation is carried out at an arrangement position thus rotated. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012248739(A) 申请公布日期 2012.12.13
申请号 JP20110120340 申请日期 2011.05.30
申请人 SHIN ETSU HANDOTAI CO LTD 发明人 AGA KOJI;YOKOGAWA ISAO;NOTO NOBUHIKO
分类号 H01L21/02;H01L21/265;H01L27/12 主分类号 H01L21/02
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