发明名称 METHOD AND APPARATUS FOR MONITORING A POLISHING SURFACE OF A POLISHING PAD USED IN POLISHING APPARATUS
摘要 PURPOSE: A monitoring method of the polished side of a polishing pad for a polishing device and an apparatus for the same are provided to ensure the flatness of the polished side of the polishing pad. CONSTITUTION: A monitoring method of the polished side of a polishing pad for a polishing device includes the following steps: the polished side(22a) of a polishing pad is conditioned by swaying a rotary dresser; the height of the polished side is measured; the position of the height measuring point is calculated on a secondary plane which is defined on the polished side; the distribution of heights in the polished side is generated by repeating the measurement and the calculation; the abnormal height distribution of the polished side is generated; and the conditioning of the polished pad is evaluated.
申请公布号 KR20120135080(A) 申请公布日期 2012.12.12
申请号 KR20120058446 申请日期 2012.05.31
申请人 EBARA CORPORATION 发明人 SHINOZAKI HIROYUKI;SHIMANO TAKAHIRO;IMAMURA AKIRA;NAKAMURA AKIRA
分类号 B24B53/017;B24B49/02 主分类号 B24B53/017
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