发明名称 |
METHOD AND APPARATUS FOR MONITORING A POLISHING SURFACE OF A POLISHING PAD USED IN POLISHING APPARATUS |
摘要 |
PURPOSE: A monitoring method of the polished side of a polishing pad for a polishing device and an apparatus for the same are provided to ensure the flatness of the polished side of the polishing pad. CONSTITUTION: A monitoring method of the polished side of a polishing pad for a polishing device includes the following steps: the polished side(22a) of a polishing pad is conditioned by swaying a rotary dresser; the height of the polished side is measured; the position of the height measuring point is calculated on a secondary plane which is defined on the polished side; the distribution of heights in the polished side is generated by repeating the measurement and the calculation; the abnormal height distribution of the polished side is generated; and the conditioning of the polished pad is evaluated. |
申请公布号 |
KR20120135080(A) |
申请公布日期 |
2012.12.12 |
申请号 |
KR20120058446 |
申请日期 |
2012.05.31 |
申请人 |
EBARA CORPORATION |
发明人 |
SHINOZAKI HIROYUKI;SHIMANO TAKAHIRO;IMAMURA AKIRA;NAKAMURA AKIRA |
分类号 |
B24B53/017;B24B49/02 |
主分类号 |
B24B53/017 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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