发明名称 Fabrication of through-silicon vias on silicon wafers
摘要 A through-silicon via fabrication method includes etching a plurality of through holes in a silicon plate. An oxide liner is deposited on the surface of the silicon plate and on the sidewalls and bottom wall of the through holes. A metallic conductor is then deposited in the through holes. In another version, which may be used concurrently with the oxide liner, a silicon nitride passivation layer is deposited on the exposed back surface of the silicon plate of the substrate.
申请公布号 US8329575(B2) 申请公布日期 2012.12.11
申请号 US20100977060 申请日期 2010.12.22
申请人 RAJAGOPALAN NAGARAJAN;PARK JI AE;YAMASE RYAN;PATEL SHAMIK;NOWAK THOMAS;XIA LI-QUN;KIM BOK HOEN;DING RAN;BALDINO JIM;NAIK MEHUL;RAMASWAMI SESH;APPLIED MATERIALS, INC. 发明人 RAJAGOPALAN NAGARAJAN;PARK JI AE;YAMASE RYAN;PATEL SHAMIK;NOWAK THOMAS;XIA LI-QUN;KIM BOK HOEN;DING RAN;BALDINO JIM;NAIK MEHUL;RAMASWAMI SESH
分类号 H01L21/4763;H01L21/31;H01L21/44 主分类号 H01L21/4763
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