发明名称 Semiconductor devices having channel layer patterns on a gate insulation layer
摘要 Semiconductor devices include a gate electrode, a gate insulation layer, a first channel layer pattern, a second channel layer pattern and first and second metallic patterns. The gate electrode is on a substrate. The gate insulation layer is on the gate electrode. The first channel layer pattern is on the gate insulation layer, and has a first conductivity level. The second channel layer pattern is on the first channel layer pattern, and has a second conductivity level that is lower than the first conductivity level. The first and second metallic patterns are on the gate insulation layer and contact respective sidewalls of the first and second channel layer patterns.
申请公布号 US8330155(B2) 申请公布日期 2012.12.11
申请号 US20090608130 申请日期 2009.10.29
申请人 JEON SANG-HUN;LEE MOON-SOOK;SAMSUNG ELECTRONICS CO., LTD. 发明人 JEON SANG-HUN;LEE MOON-SOOK
分类号 H01L29/786 主分类号 H01L29/786
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