| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor chip and an inspection method for the semiconductor chip enabling inspecting a semiconductor chip, having an installed communication circuit for handling high frequency signals, with high accuracy using a low-cost inspection device. <P>SOLUTION: A semiconductor chip having a plurality of installed functional blocks functioning as communication circuits includes, in one functional block to be inspected, a test signal supply circuit for supplying frequency signals for testing and an external output circuit for detecting the signal intensity of a signal generated by the functional block and for externally outputting an intensity signal indicative of the signal intensity. <P>COPYRIGHT: (C)2013,JPO&INPIT |
