发明名称 |
FEATURE VALUE ESTIMATION DEVICE AND METHOD THEREOF, SPECTROSCOPIC IMAGE PROCESSING DEVICE AND METHOD THEREOF, AND COMPUTER PROGRAM |
摘要 |
<P>PROBLEM TO BE SOLVED: To estimate a feature value with high accuracy without requiring an expensive spectrometer. <P>SOLUTION: The feature amount estimation device for estimating a feature value relating to a specific component of a specimen includes: a spectroscopic estimation parameter storing part 36 that stores a spectroscopic estimation parameter for converting a plurality of band images different in wavelength band to spectra; a calibration parameter storing part 38 that stores a calibration parameter for converting the spectra to the feature value; a multiband image acquiring part that acquires a multiband image obtained by imaging the specimen with a plurality of wavelength bands including a predetermined wavelength band corresponding to the specific component; a spectroscopic estimation part 16 that calculates spectra from the multiband image using the spectroscopic estimation parameter; and a calibration part 18 that calculates the feature value from the spectra using the calibration parameter. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012242270(A) |
申请公布日期 |
2012.12.10 |
申请号 |
JP20110113483 |
申请日期 |
2011.05.20 |
申请人 |
SEIKO EPSON CORP |
发明人 |
KANAI MASAFUMI;ARAI YOSHIFUMI |
分类号 |
G01N21/27;G01J3/36 |
主分类号 |
G01N21/27 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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