| 摘要 |
<P>PROBLEM TO BE SOLVED: To perform waveform measurement of a highly accurate and wide-band frequency. <P>SOLUTION: A waveform measuring instrument 1 includes: a highly accurate waveform apparatus 5 for measuring a waveform; a wide-band waveform measuring apparatus 6 for measuring a waveform of a wide-band frequency the accuracy of which is lower than that of the highly accurate waveform measuring apparatus 5; an operation unit 14 for calculating a gain error ΔG and an offset error ΔA of wide-band waveform data WD measured by the wide-band waveform measuring apparatus 6 on the basis of highly accurate waveform data HD measured by the highly accurate waveform measuring apparatus 5; and a correction unit 15 for correcting the wide-band waveform data WD only by the gain error ΔG and the offset error ΔA. Since the wide-band waveform data WD of a wide band can be corrected based on the highly accurate waveform data WD of high accuracy, waveform measurement of a highly accurate and wide-band frequency can be achieved. <P>COPYRIGHT: (C)2013,JPO&INPIT |
