发明名称 MONOCHROMATOR FOR CHARGED PARTICLE BEAM APPARATUS, AND ELECTRONIC APPARATUS USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To realize a monochromator which reduces energy spread of a primary electron beam and improves resolution of a low-voltage SEM. <P>SOLUTION: A monochromator 500 is formed which comprises: a first dispersion unit 200 and a second dispersion unit 400, aligned with an optical axis Z, for deflecting a charged particle beam with a normal energy and an energy spread; an energy-limit aperture 300 at a central plane 310 between the first and second dispersion units; and a beam adjustment element 100 for focusing the charged particle beam. A virtual crossover S6 of the charged particle beam is formed between the first dispersion unit 200 and the energy-limit aperture 300. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012243763(A) 申请公布日期 2012.12.10
申请号 JP20120108162 申请日期 2012.05.10
申请人 HERMES MICROVISION INC 发明人 REN WAIMING;CHEN ZHONGWEI
分类号 H01J37/05;H01J37/09;H01J37/153;H01J37/28;H01J37/29 主分类号 H01J37/05
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