| 摘要 |
<P>PROBLEM TO BE SOLVED: To enable individual evaluation tests for a memory cell connected to other adjacent word lines and a short-circuited word line. <P>SOLUTION: The semiconductor device includes a pre-decoding circuit for simultaneously activating a plurality of pre-decoding signals for driving each of a plurality of sub-word lines connected to one main word line, when a test mode signal to be input is activated. <P>COPYRIGHT: (C)2013,JPO&INPIT |
