| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a microchip capable of measuring multiple kinds of measurement objects (multiple item inspection) by one detection part, and also to provide a measurement system and measurement method using the same. <P>SOLUTION: A microchip is used for measuring multiple kinds of measurement objects, including at least a reagent holding part and a detection part. The reagent holding part includes multiple kinds of inspection reagents corresponding to each one of the multiple kinds of measurement objects. All the multiple time courses become different concerning changes in detection values in the detection part, which are generated by reactions between the respective inspection reagents and the measurement objects corresponding to the reagents. <P>COPYRIGHT: (C)2013,JPO&INPIT |
