发明名称 SiC SINGLE CRYSTAL, SiC WAFER, AND SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide an SiC single crystal in which basal plane dislocations are highly oriented, and to provide an SiC wafer and a semiconductor device, that are produced from such an SiC single crystal. <P>SOLUTION: The SiC single crystal has one or more orientation regions where linearity of basal plane dislocations is high, and the basal plane dislocations are oriented in the three crystallographically equivalent <11-20> directions. The SiC wafer and the semiconductor device are manufactured from such an SiC single crystal. This SiC single crystal can be manufactured by using a seed crystal that has a small offset angle on the ä0001} plane highest portion side and a large offset angle on the offset direction downstream side, and by growing a new crystal on the seed crystal. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012240859(A) 申请公布日期 2012.12.10
申请号 JP20110109773 申请日期 2011.05.16
申请人 TOYOTA CENTRAL R&D LABS INC;TOYOTA MOTOR CORP;DENSO CORP 发明人 GUNJISHIMA TSUKURU;URAGAMI YASUSHI;ADACHI AYUMI
分类号 C30B29/36;H01L29/161 主分类号 C30B29/36
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