发明名称 METAL FOREIGN MATTER DETECTION METHOD OF NON-CONTACT POWER SUPPLY DEVICE, NON-CONTACT POWER SUPPLY DEVICE, POWER RECEIVER PROVIDED TO ELECTRICAL EQUIPMENT AND NON-CONTACT POWER SUPPLY SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide a metal foreign matter detection method of a non-contact power supply device capable of detecting a metal foreign matter without changing an excitation frequency of a power supply coil of the non-contact power supply device, and being inexpensively manufactured, the non-contact power supply device, a power receiver provided to electrical equipment and a non-contact power supply system. <P>SOLUTION: An oscillation signal is transmitted from a metal detection circuit 33 provided to a power supply device 1 to a modulation circuit 16 of equipment E. In the modulation circuit 16 of the equipment E, a rectangular wave pulse signal is generated from the oscillation signal, a period of the rectangular wave pulse signal is changed based on presence/absence of a metal piece, and the rectangular wave pulse signal is modulated into a modulated wave signal to be transmitted to the metal detection circuit 33. In the metal detection circuit 33 of the power supply device 1, the modulated wave signal is demodulated, a period of the demodulated demodulation signal, namely, the rectangular wave pulse signal is measured to determine the presence/absence of the metal piece. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012244778(A) 申请公布日期 2012.12.10
申请号 JP20110112629 申请日期 2011.05.19
申请人 PANASONIC CORP 发明人 HYODO SATOSHI
分类号 H02J17/00 主分类号 H02J17/00
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