| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a technology for accurately detecting a defect of a sub-word line drive circuit. <P>SOLUTION: A method for testing a sub-word line drive circuit for receiving a sub-word selection signal supplied through a sub-word selection line includes a technology for supplying a Hi-Z signal and a Hi signal to the sub-word line drive circuit by improved FXT output circuit and FXB output circuit. <P>COPYRIGHT: (C)2013,JPO&INPIT |
