| 摘要 |
<P>PROBLEM TO BE SOLVED: To reduce a load on a designer by automatically generating information for improving reliability of an electronic apparatus. <P>SOLUTION: A failure rate comparison analysis unit 210 refers to estimated failure rate data 119 and target failure rate data 291 to determine a type of component parts having the estimated failure rates higher than the target failure rates as an "improvement target type". A parallel connection part determination unit 221 refers to a part list 293 to determine component parts of the improvement target type as "improvement part candidates". The parallel connection part determination unit 221 refers to substrate circuit diagram data 292 to determine a component part of a connection destination as a "connection destination part" by each improvement part candidate. On the basis of the connection destination part determined by each improvement part candidate, the parallel connection part determination unit 221 determines a combination of improvement part candidates to be connected in parallel as an "improvement target combination". The parallel connection part determination unit 221 outputs improvement point data 209 which indicates the improvement target combination. <P>COPYRIGHT: (C)2013,JPO&INPIT |
