发明名称 INSPECTION REGION SETTING METHOD AND X-RAY INSPECTION SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide an X-ray inspection method which is capable of accurately setting an inspection region in a target object to be inspected when using an X-ray image to inspect the target object to be inspected. <P>SOLUTION: An inspection region setting method of setting an inspection region in a target to be inspected in an X-ray inspection device which executes inspection of the target to be inspected includes: a step (S104) of picking up a visible image of a first region including an inspection object of the target to be inspected; a step (S112) of picking up an X-ray image of a second region including the inspection object of the target to be inspected; a step (S118) of simultaneously displaying the visible image of the first region and the X-ray image of the second region in the same position with the same scale factor together with a mark indicating the position of the inspection object; and a step (S120) of accepting the input of confirmation about the position of the displayed mark indicating the inspection object and the position of the inspection object in the X-ray image and settling the inspection region. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012237729(A) 申请公布日期 2012.12.06
申请号 JP20110108608 申请日期 2011.05.13
申请人 OMRON CORP 发明人 MURAKAMI KIYOSHI
分类号 G01N23/04 主分类号 G01N23/04
代理机构 代理人
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