发明名称 PROBE FOR ULTRASONIC FLAW INSPECTION AND SCANNER FOR ULTRASONIC FLAW INSPECTION
摘要 <P>PROBLEM TO BE SOLVED: To apply a probe to a pipe disposed near a ceiling and a wall of a building by minimizing, as much as possible, the probe and a scanning mechanism for rotating the probe along the outer peripheral surface of the pipe. <P>SOLUTION: The probe includes a head 1 that applies ultrasonic waves to a pipe subject to an inspection while coming into contact with the outer peripheral surface of the pipe and receives its reflection wave, the probe being detachably attached to the pipe. The head includes a pair of openable/closable levers 3 for grasping the pipe with their coming into contact with two points of the outer peripheral surface thereof, the levers 3 being constantly energized in the closing direction. The head 1 is disposed between the fulcrums of the pair of levers 3, and the surface of the head 1 coming into contact with the outer peripheral surface of the pipe is a recessed curved surface with a curvature matching the pipe outside diameter. The head is configured to accommodate the pipe in the recess, and the pair of levers 3 and the surface of the head 1 accommodate the half circumference or more of the pipe. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012237765(A) 申请公布日期 2012.12.06
申请号 JP20120193491 申请日期 2012.09.03
申请人 TAIYO NIPPON SANSO CORP 发明人 OCHIAI TOSHIMITSU
分类号 G01N29/26;G01N29/04 主分类号 G01N29/26
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